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Infographic: Particle Measuring Systems – Process Tool Sample Points

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Infographic: Particle Measuring Systems – Process Tool Sample Points

Particle Measuring Systems — Process Tool Sample Points

CUSTOMER:
Particle Measuring Systems, Boulder CO

PROJECT DETAILS:
Diagram shows sensor locations and sampling sequence inside a semiconductor wafer cleaning process tool. NanoAir and Particle Seeker are two purpose-built 10 nm condensation particle counters designed for use in the most critical fabrication cleanroom spaces.